← Advisories

LEADTOOLS ActiveX Raster Twain v16.5 (LtocxTwainu.dll) Remote Buffer Overflow PoC

High
Advisory ID
ZSL-2010-4960
Release Date
28 August 2010
Vendor
LEAD Technologies, Inc. - http://www.leadtools.com
Affected Version
16.5.0.2
CVE
N/A
Tested On
Microsoft Windows XP Professional SP3 (EN), Windows Internet Explorer 8.0.6001.18702, RFgen Mobile Development Studio 4.0.0.06 (Enterprise)
Summary

With LEADTOOLS you can control any scanner, digital camera or capture card that has a TWAIN (32 and 64 bit) device driver. High-level acquisition support is included for ease of use while low-level functionality is provided for flexibility and control in even the most demanding scanning applications.

Description

The Raster Twain Object Library suffers from a buffer overflow vulnerability because it fails to check the boundry of the user input.

(2c4.2624): Access violation - code c0000005 (first chance) First chance exceptions are reported before any exception handling. This exception may be expected and handled. eax=00130041 ebx=100255bc ecx=01649000 edx=00183984 esi=0013ef6c edi=00000000 eip=7c912f4e esp=0013eda8 ebp=0013eda8 iopl=0 nv up ei pl nz na pe nc cs=001b ss=0023 ds=0023 es=0023 fs=003b gs=0000 efl=00010206 ntdll!wcscpy+0xe: 7c912f4e 668901 mov word ptr [ecx],ax ds:0023:01649000=???? 0:000> g (2c4.2624): Access violation - code c0000005 (first chance) First chance exceptions are reported before any exception handling. This exception may be expected and handled. eax=00410039 ebx=00410039 ecx=00150000 edx=00150608 esi=00150000 edi=00410041 eip=7c96c540 esp=0013f220 ebp=0013f228 iopl=0 nv up ei pl nz na pe nc cs=001b ss=0023 ds=0023 es=0023 fs=003b gs=0000 efl=00010206 ntdll!RtlpNtMakeTemporaryKey+0x6a74: 7c96c540 807b07ff cmp byte ptr [ebx+7],0FFh ds:0023:00410040=??
Proof of Concept
Disclosure Timeline
N/A
Credits
Vulnerability discovered by Gjoko Krstic
References
Changelog
28.08.2010Initial release
29.08.2010Added reference [3]
30.08.2010Added reference [4]
01.09.2010Added reference [5]
26.10.2010Added reference [6]